| File | File in archive | Date | Context | Size | DLs | Mfg | Model |
| BE1460.zip | BE1460.zip | 19/06/22 | Becker Mexico 2000 BE 1460
| 2 kB | 49 | BECKER | BE1460 |
| 1460.TXT | 1460.TXT | 15/05/20 | Becker Mexico 2000 BE 1460
| 1 kB | 108 | BECKER | 1460 |
| BECK1100.TXT | BECK1100.TXT | 20/05/20 | BECKER EUROPA BE 1100 (1.VER)
========= | 0 kB | 57 | BECKER | BECK1100 |
| BEC0749.TXT | BEC0749.TXT | 19/05/20 | BECKER AVUS CASSETTE BE0778/BE0749/BE07 | 0 kB | 40 | BECKER | BEC0749 |
| be2237_becker_grand_prix.rar | be2237_becker_grand_prix.rar | 16/08/22 | BECKER GRAND PRIX BE 2237
============= | 74 kB | 38 | BECKER | be2237 grand prix |
| BEEU1100.TXT | BEEU1100.TXT | 14/05/20 | BECKER EUROPA BE1100 (2.VER)
========== | 0 kB | 22 | BECKER | BEEU1100 |
| ME2237.TXT | ME2237.TXT | 19/05/20 | BECKER GRAND PRIX BE 2237
============= | 0 kB | 35 | BECKER | ME2237 |
|
| Europa BE 1100.txt | Europa BE 1100.txt | 14/05/20 | Becker Europa BE 1100
proc. : M83C15 | 0 kB | 112 | BECKER | Europa BE 1100 |
| a-134.pdf | a-134.pdf | 04/03/20 | ON-WAFER MEASUREMENTS
WI | 8695 kB | 3 | HP | a-134 |
| Be1150.txt | Be1150.txt | 14/05/20 | Mersedes Benz Classic ( Becker Classic B | 2 kB | 177 | BECKER | Be1150 |
| README.TXT | README.TXT | 21/05/20 | BECKER EUROPA 2000
EEPRM Micrichip 85C | 0 kB | 28 | BECKER | README |
| BE1100.TXT | BE1100.TXT | 20/05/20 | MODEL BECKER EUROPA 2000 - be1100
be1 | 0 kB | 63 | BECKER | BE1100 |
| MERCEDES BE4410 AUDIO 10 PROD OFF.rar | INFO.txt | 25/05/16 | Name/Ime - MERCEDES
Model - BE4410 AUDI | 1 kB | 569 | BECKER | BE4410 AUDIO 10 |
| a-133.pdf | a-133.pdf | 27/02/20 | 40 GHz ON-WAFER MEASUREMENTS
| 6355 kB | 3 | HP | a-133 |
|
| 5988-6522EN.pdf | 5988-6522EN.pdf | 16/02/20 | Agilent
In-Fixture Characterization Usin | 2902 kB | 0 | HP | 5988-6522EN |
| 5991-4494EN Wafer-level Measurement Solutions - Component Measurements c20140814 [2].pdf | 5991-4494EN Wafer-level Measurement Solutions - Component Measurements c20140814 [2].pdf | 30/08/20 | Wafer-Level Component
Measurement
Keysig | 738 kB | 1 | Agilent | 5991-4494EN Wafer-level Measurement Solutions - Component Measurements c20140814 [2] |
| 5991-4631EN Wafer-level Measurement Solutions - Overview c20140814 [2].pdf | 5991-4631EN Wafer-level Measurement Solutions - Overview c20140814 [2].pdf | 29/08/20 | Wafer-Level Measurement
Solutions
Keysig | 354 kB | 1 | Agilent | 5991-4631EN Wafer-level Measurement Solutions - Overview c20140814 [2] |
| 5988-5102EN.pdf | 5988-5102EN.pdf | 20/02/20 | Agilent
Evaluation of MOS
Capacitor Oxid | 1575 kB | 0 | HP | 5988-5102EN |
| Attenuation Measurement of Step Attenuators 5991-1268EN c20140520 [10].pdf | Attenuation Measurement of Step Attenuators 5991-1268EN c20140520 [10].pdf | 27/08/20 | Keysight Technologies
High Attenuation M | 845 kB | 1 | Agilent | Attenuation Measurement of Step Attenuators 5991-1268EN c20140520 [10] |
| 5988-3279EN.pdf | 5988-3279EN.pdf | 13/03/20 | Agilent
Accurate Impedance
Measurement w | 2308 kB | 0 | HP | 5988-3279EN |